在芯片DFT中插入scan chain 的长度以及每条链上的 ... - 知乎
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当然上述是scan chain的基本思想，scan的具体过程在电路中的应用也是相对复杂的，因其横跨了芯片设计的整个周期，各个角落，在设计scan test的时候需要综合考虑到芯片设计的方方面面，包括时钟设计，电源设计，芯片结构，PAD资源，逻辑综合规划等。 2.
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