半导体器件失效分析手法中，OBRICH 、Thermal、EMMI 分别是什么？ - 知乎
11 July 2025 admin
Download 半导体器件失效分析手法中，OBRICH 、Thermal、EMMI 分别是什么？ - 知乎 book pdf free download link or read online here in PDF. Read online 半导体器件失效分析手法中，OBRICH 、Thermal、EMMI 分别是什么？ - 知乎 book pdf free download link book now. All books are in clear copy here, and all files are secure so don't worry about it. This site is like a library, you could find million book here by using search box in the header.
Thermal测试机台，分为制冷型和非制冷型两种。 制冷型Thermal通常收集3~5µm的短波红外，非制冷型Thermal通常收集8~14µm长波红外。 所以通过半波长我们可以推算出，制冷红外高倍物镜下的极限分辨率约为2µm；非制冷红外物镜的极限分辨率约为5µm。
Read : 半导体器件失效分析手法中，OBRICH 、Thermal、EMMI 分别是什么？ - 知乎 pdf book online
Select one of servers for direct link: | | |
|---|
Copyright Disclaimer:
All books are the property of their respective owners.This site does not host pdf files, does not store any files on its server, all document are the property of their respective owners.
This site is Google powered search engine that queries Google to show PDF search results.
This site is custom search engine powered by Google for searching pdf files. All search results are from google search results. Please respect the publisher and the author for their creations if their books are copyrighted. Please contact google or the content providers to delete copyright contents if any and email us, we'll remove relevant links or contents immediately.
Related 半导体器件失效分析手法中，OBRICH 、Thermal、EMMI 分别是什么？ - 知乎