可能是DFT最全面的介绍--Scan - 知乎
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把Scan-En设成1，然后把enable clock来驱动寄存器，在Scan-In端输入测试数据，然后在输出端Scan-Out观测，用此种方法便可以测试Flip-Flop. 测试组合逻辑的时候，把Scan-En设成1，然后enable clock来驱动寄存器，在Scan-In端输入测试数据，两个时钟周期后，数据便会送到组合逻辑的输入端。
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